urn:nasa:pds:context:instrument:arc-ocf.flimetrics-kla_f40-uvx 1.0 1.25.0.0 Product_Context 2026-04-13 1.0 Initial creation of the context product. urn:nasa:pds:context:facility:laboratory.arc-ocf instrument_to_facility Filmetrics-KLA F40-UVX Reflectance Microscope Microscope Ultraviolet Visible Near-Infrared The Filmetrics-KLA F40-UVX reflectance microscope allows characterization of the optical properties of thin film samples from the ultraviolet to the near-infrared (0.2–1.7 µm). The OCF F40-UVX instrument is equipped with a x10 objective, and different apertures (50, 100, 250, and 500 µm) that allow measurements to be conducted on spots as small as 5 µm in diameter, hence enabling the characterization of spectral properties of both homogeneous and inhomogeneous samples.