ancillary_product_type in Ancillary_​Product

Name: ancillary_product_typeVersion Id: 1.0.0.0
Description: The ancillary_product_type element provides the type of data found in an ancillary product.
Namespace Id: speclibSteward: geoClass Name: Ancillary_​ProductType: UTF8_​Short_​String_​Collapsed
Minimum Value: NoneMaximum Value: NoneMinimum Characters: 1Maximum Characters: 255
Unit of Measure Type: NoneDefault Unit Id: NoneAttribute Concept: NoneConceptual Domain: SHORT_STRING
Status: ActiveNillable: falsePattern: None
Permissible Value(s)ValueValue Meaning
 Attenuated Total Reflectance Spectroscopy IR spectroscopic technique in which placing a sample next to a high refractive index crystal causes total internal reflection resulting in an evanescent wave that samples shallow properties of the sample
 Chemical CompositionElemental or oxide abundances for samples
 Differential Scanning Calorimetry Technique in which the sample is heated and temperature is monitored to evaluate exothermic and endothermic reactions that are indicative of composition
 Electron Microprobe Analysis Microprobe technique in which the sample is bombarded with electrons, with resultant X-ray emission spectra indicative of sample composition
 Image An image of the sample
 Modal Mineralogy Sample mineral abundances defined as weight or volume percentages
 Raman Spectroscopy Spectroscopic technique based on based on inelastic scattering of monochromatic light, usually from a laser source
 Reflectance Spectroscopy Spectroscopic technique based on measuring the spectral properties of light scattered from samples
 Thermogravimetric Analysis Technique in which sample mass is measured as its temperature is increased
 Transmission Spectroscopy Spectroscopic technique based on measuring the spectral properties of light transmitted through samples
 X-ray Diffraction X-rays diffracted by a sample as a function of incident angle are used to determine sample crystal structure
 X-ray Fluorescence Spectroscopic technique in which the sample is bombarded by high-energy X-rays or gamma rays, with fluorescent X-ray emission spectra indicative of sample composition