Name: measurement_type | Version Id: 1.0.0.0 | ||
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Description: The measurement_type element identifies the type of spectroscopy performed on a specimen. | |||
Namespace Id: speclib | Steward: geo | Class Name: Measurement_Parameters | Type: UTF8_Short_String_Collapsed |
Minimum Value: None | Maximum Value: None | Minimum Characters: 1 | Maximum Characters: 255 |
Unit of Measure Type: None | Default Unit Id: None | Attribute Concept: None | Conceptual Domain: SHORT_STRING |
Status: Active | Nillable: false | Pattern: None | |
Permissible Value(s) | Value | Value Meaning | |
Attenuated Total Reflectance | Attenuated total reflectance (ATR) is a sampling technique used in conjunction with infrared spectroscopy which enables samples to be examined directly in the solid or liquid state without further preparation. | ||
Emission | The Emission value indicates emission spectroscpy, which examines the wavelengths emitted by atoms or molecules during their transition from an excited state to a lower energy state. | ||
LIBS | LIBS (Laser-Induced Breakdown Spectroscopy) uses a highly energetic laser pulse as its excitation source to produce emission spectra. | ||
Raman | The Raman value indicates Raman spectroscopy, which determines information about a material by studying the Raman scattering of monochromatic light off the material. | ||
Reflectance | The Reflectance value indicates reflectance spectroscopy, the study of light as a function of wavelength that has been reflected or scattered from a material. | ||
Transmission | The Transmission value indicates transmission spectroscopy, the study of light as a function of wavelength that has been transmitted through a material. | ||
X-Ray Absorption Near-Edge Structure | The X-ray Absorption Near-Edge Structure value indicates XANES spectroscopy, which determines information about a material by studying the X-ray absorption spectra of electronic transitions within an atomic core. | ||
X-Ray Diffraction | The X-Ray Diffraction value indicates x-ray diffraction spectroscopy, which studies the diffraction patterns of x-rays scattered off a material. | ||
X-Ray Fluorescence | The X-Ray Fluorescence value indicates x-ray flourescence spectroscopy, which examines the emission of x-rays from a material previously bombarded with high energy x-rays or gamma rays. |