DATA_SET_DESCRIPTION |
Data Set Overview
=================
THIS DATA SET CONTAINS THE DERIVED VALUES FOR THE ELECTRON
MOMENT DENSITY AND TEMPERATURE AT JUPITER IN THE PLS ENERGY
RANGE (10-5950 EV) DURING THE VOYAGER 2 ENCOUNTER. ADJACENT
LOW AND HIGH ENERGY ELECTRON MEASUREMENTS ARE COMBINED TO FORM
A COMPOSITE SPECTRA WHICH IS USED FOR THE MOMENT CALCULATION.
THE MOMENT CALCULATIONS ARE PERFORMED AS DESCRIBED IN SCUDDER
ET AL. (1981). THESE ASSUME ISOTROPIC DISTRIBUTIONS AND
CORRECT FOR POSITIVE SPACECRAFT CHARGE WHEN APPLICABLE AND
INTERPOLATE ELECTRON SPECTRA BELOW THE 10 EV INSTRUMENT
THRESHOLD BEFORE PERFORMING THE INTEGRATION OVER VELOCITY.
DATA FORMAT: COLUMNS 1-6 ARE TIME (YEAR, DAY, HOUR, MIN, SEC,
MSEC) COLUMN 7 IS THE MOMENT DENSITY IN CM-3, COLUMN 8 THE
TEMPERATURE IN EV. EACH ROW HAS FORMAT (6I4, 2E12.3). VALUES
OF 1.E32 INDICATE THAT THE PARAMETER COULD NOT BE OBTAINED FROM
THE DATA USING THE STANDARD ANALYSIS TECHNIQUE. ADDITIONAL
INFORMATION ABOUT THIS DATASET AND THE INSTRUMENT WHICH
PRODUCED IT CAN BE FOUND ELSEWHERE IN THIS CATALOG. AN
OVERVIEW OF THE DATA IN THIS DATA SET CAN BE FOUND IN SCUDDER
ET AL. (1981) AND A COMPLETE INSTRUMENT DESCRIPTION CAN BE
FOUND IN BRIDGE (1977).
Processing Level Id : 5
Software Flag : Y
Processing Start Time : UNK
Processing Stop Time : UNK
Parameters
==========
Sampling Parameter Name : TIME
Data Set Parameter Name : ELECTRON DENSITY
Sampling Parameter Resolution : 96.000000
Sampling Parameter Interval : 96.000000
Minimum Available Sampling Int : 96.000000
Data Set Parameter Unit : CM-3
Sampling Parameter Unit : SECOND
Description
-----------
A derived parameter giving an indication of the mean A
derived parameter equaling the number of electrons per unit
volume over a specified range of electron energy.
energy/electron, assuming the shape of the electron energy
Different forms of electron density are derived spectrum to
be Maxwellian (i.e.highest entropy shape). Given
distinguished by method of derivation (Maxwellian fit, that
the electron energy spectrum is not exactly Maxwellian,
method of moments) or by the some selection criteria (ie.,
the electron temperature can be defined integrally (whereby
the mean energy obtained by integrating under the actual hot
electron and cold electron density). In general, if more
electron energy spectrum is set equal to the integral under
than one electron component is analyzed, either by moment or
fit, a total density will be provided which is the sum of a
Maxwellian, where the temperature is a free parameter for the
electron densities. If the electron do not have a which to
solve), or differentially (whereby the slopes of Maxwellian
distribution the actual distribution can be the actually
electron energy spectrum at various energies are matched to
the slopes of a corresponding Maxwellian). represented as
the sum of several Maxwellians, in which case the density of
each Maxwellian is given. The temperature parameter is often
qualified with a range of applicable energies. temperatures
can be angularly anisotropic. If the electrons do not have a
Maxwellian distribution the actual distribution can be
represented as the sum of several Maxwellians, each with a
separate temperature.
Source Instrument Parameters
============================
Instrument Host ID : VG2
Data Set Parameter Name : ELECTRON DENSITY
Instrument Parameter Name : ELECTRON RATE
Important Instrument Parameters : 1
Instrument Host ID : VG2
Data Set Parameter Name : ELECTRON DENSITY
Instrument Parameter Name : ELECTRON CURRENT
Important Instrument Parameters : 1
Instrument Host ID : VG2
Data Set Parameter Name : ELECTRON TEMPERATURE
Instrument Parameter Name : ELECTRON RATE
Important Instrument Parameters : 1
Instrument Host ID : VG2
Data Set Parameter Name : ELECTRON TEMPERATURE
Instrument Parameter Name : ELECTRON CURRENT
Important Instrument Parameters : 1
Processing
==========
Processing History
------------------
Source Data Set ID : VG2-PLS
Software : UNK
Product Data Set ID : VG2-J-PLS-5-ELE-MOM-96.0SEC
|
CONFIDENCE_LEVEL_NOTE |
Overview
========
THIS DATA SET PROVIDES THE BEST ESTIMATE AVAILABLE OF THE TOTAL
ELECTRON DENSITY IN THE PLS ENERGY RANGE (10-5950 EV). FOUR
ASSUMPTIONS WERE MADE 1) SECONDARY ELECTRONS ESCAPING FROM THE
COLLECTOR PLATE OF THE DETECTOR WERE NEGLECTED; 2)
EXTRAPOLATIONS WERE MADE TO ESTIMATE THE NUMBER OF ELECTRONS
OUTSIDE THE PLS ENERGY RANGE; 3) ELECTRONS WERE ASSUMED TO HAVE
ISOTROPIC DISTRIBUTIONS; 4) WHERE THE SPACECRAFT POTENTIAL WAS
SMALL THE SHAPE OF THE THERMAL ELECTRON SPECTRA WAS USED TO
ESTIMATE THE CHARGE AND CORRECT THE DERIVED DENSITIES. 1)
SHOULD RESULT IN AN UNDERESTIMATE OF THE ELECTRON DENSITY BY NO
MORE THAN 10% FOR TE < 100EV AND NO MORE THAN 30% FOR TE >
100EV. 2) GIVES UNCERTAINTIES OF AT MOST 10%, AND USUALLY MUCH
SMALLER, FOR TE = 5-3000 EV WHICH IS THE TE RANGE MEASURED IN
THIS REGION. 3) SHOULD BE AN EXCELLENT ASSUMPTION SINCE
ISOTROPIZATION TIMES FOR ELECTRONS ARE FAST, AND SINCE THE
ELECTRON THERMAL SPEED IS ALWAYS MUCH GREATER THAN THE PLASMA
FLOW SPEED. 4) IN REGIONS WHERE THE SPACECRAFT CHARGE IS
POSITIVE, CHARGING PRODUCES UNCERTAINTIES OF AT MOST 10%.
VALUES OF TE IN ALL REGIONS HAVE UNCERTAINTIES APPROXIMATELY
EQUAL TO THE DENSITY UNCERTAINTIES.
|
ABSTRACT_TEXT |
THIS DATA SET CONTAINS THE DERIVED VALUES FOR THE ELECTRON MOMENT
DENSITY AND TEMPERATURE AT JUPITER IN THE PLS ENERGY RANGE
(10-5950 EV) DURING THE VOYAGER 2 ENCOUNTER. ADJACENT LOW AND
HIGH ENERGY ELECTRON MEASUREMENTS ARE COMBINED TO FORM A
COMPOSITE SPECTRA WHICH IS USED FOR THE MOMENT CALCULATION. THE
MOMENT CALCULATIONS ARE PERFORMED AS DESCRIBED IN SCUDDER ET AL.
(1981). THESE ASSUME ISOTROPIC DISTRIBUTIONS AND CORRECT FOR
POSITIVE SPACECRAFT CHARGE WHEN APPLICABLE AND INTERPOLATE
ELECTRON SPECTRA BELOW THE 10 EV INSTRUMENT THRESHOLD BEFORE
PERFORMING THE INTEGRATION OVER VELOCITY. DATA FORMAT: COLUMNS
1-6 ARE TIME (YEAR, DAY, HOUR, MIN, SEC, MSEC) COLUMN 7 IS THE
MOMENT DENSITY IN CM-3, COLUMN 8 THE TEMPERATURE IN EV. EACH ROW
HAS FORMAT (6I4, 2E12.3). VALUES OF 1.E32 INDICATE THAT THE
PARAMETER COULD NOT BE OBTAINED FROM THE DATA USING THE STANDARD
ANALYSIS TECHNIQUE. ADDITIONAL INFORMATION ABOUT THIS DATASET AND
THE INSTRUMENT WHICH PRODUCED IT CAN BE FOUND ELSEWHERE IN THIS
CATALOG. AN OVERVIEW OF THE DATA IN THIS DATA SET CAN BE FOUND IN
SCUDDER ET AL. (1981) AND A COMPLETE INSTRUMENT DESCRIPTION CAN
BE FOUND IN BRIDGE (1977).
|