| Description: The ancillary_product_type element provides the type of data found in an ancillary product. |
| Namespace Id: speclib | Steward: geo | Class Name: Ancillary_Product | Type: UTF8_Short_String_Collapsed |
| Minimum Value: None | Maximum Value: None | Minimum Characters: 1 | Maximum Characters: 255 |
| Unit of Measure Type: None | Default Unit Id: None | Attribute Concept: None | Conceptual Domain: SHORT_STRING |
| Status: Active | Nillable: false | Pattern: None |
| Permissible Value(s) | Value | Value Meaning |
| | Attenuated Total Reflectance Spectroscopy | IR spectroscopic technique in which placing a sample next to a high refractive index crystal causes total internal reflection resulting in an evanescent wave that samples shallow properties of the sample |
| | Chemical Composition | Elemental or oxide abundances for samples |
| | Differential Scanning Calorimetry | Technique in which the sample is heated and temperature is monitored to evaluate exothermic and endothermic reactions that are indicative of composition |
| | Electron Microprobe Analysis | Microprobe technique in which the sample is bombarded with electrons, with resultant X-ray emission spectra indicative of sample composition |
| | Image | An image of the sample |
| | Modal Mineralogy | Sample mineral abundances defined as weight or volume percentages |
| | Raman Spectroscopy | Spectroscopic technique based on based on inelastic scattering of monochromatic light, usually from a laser source |
| | Reflectance Spectroscopy | Spectroscopic technique based on measuring the spectral properties of light scattered from samples |
| | Thermogravimetric Analysis | Technique in which sample mass is measured as its temperature is increased |
| | Transmission Spectroscopy | Spectroscopic technique based on measuring the spectral properties of light transmitted through samples |
| | X-ray Diffraction | X-rays diffracted by a sample as a function of incident angle are used to determine sample crystal structure |
| | X-ray Fluorescence | Spectroscopic technique in which the sample is bombarded by high-energy X-rays or gamma rays, with fluorescent X-ray emission spectra indicative of sample composition |